Pattern Run - Length for Test Data Compression
نویسندگان
چکیده
This paper presents a new pattern run-length compression method whose decompressor is simple and easy to implement. It encodes 2|n| runs of compatible or inversely compatible patterns, either inside a single test data segment or across multiple test data segments. Experimental results show that it can achieve an average compression ratio of 67.64% and considerable test application time savings.
منابع مشابه
$2^{n}$ Pattern Run-Length for Test Data Compression
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